Raman characterization of MoS2 microtube

Physica Status Solidi (B) Basic Research

Volumn 246, Issue 11-12, 2009, Pages 2782-2785

  Viršek, Marko ^a   Krause, Matthias ^b   Kolitsch, Andreas ^b   Remškar, Maja ^a  

^a JO EF STEFAN INSTITUTE   (Slovenia)

^b INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

LAYERED SEMICONDUCTORS; MOLYBDENUM COMPOUNDS; SINGLE CRYSTALS;

63.22.GH; 68.35.JA; 78.30.HV; 81.07.DE; ABSORBING MATERIALS; CHEMICAL TRANSPORT REACTIONS; POSSIBLE MECHANISMS; RAMAN CHARACTERIZATION;

SULFUR COMPOUNDS;

EID: 77149140112     PISSN: 03701972     EISSN: 15213951     Source Type: Journal    
DOI: 10.1002/pssb.200982281     Document Type: Article

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