Structural and chemical composition studies of pulsed laser deposited β-Al-Mg thin films

Journal of Microscopy

Volumn 237, Issue 3, 2010, Pages 384-387

  Radziszewska, A ^a  

^a AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

Author keywords

Al Mg thin films; SEM; TEM

Indexed keywords

ALUMINUM ALLOYS; BINARY ALLOYS; ENERGY DISPERSIVE SPECTROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MAGNESIUM ALLOYS; NANOCRYSTALS; PULSED LASER DEPOSITION; PULSED LASERS; SCANNING ELECTRON MICROSCOPY;

AL-MG THIN FILM; CHEMICAL COMPOSITIONS; COMPOSITION STUDY; ENERGY DISPERSIVE X RAY SPECTROSCOPY; FLUENCES; LASER FLUENCES; MG THIN FILMS; STRUCTURAL COMPOSITION; TEM; THIN-FILMS;

THIN FILMS;

ALUMINUM; MAGNESIUM;

ARTICLE; CHEMICAL COMPOSITION; CHEMICAL STRUCTURE; FILM; LASER; MORPHOLOGY; PRIORITY JOURNAL; ROENTGEN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 77149135746     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2009.03266.x     Document Type: Article

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