Measuring Residual Stress in bilayer laminate by curvature method

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 7375, Issue , 2009, Pages

  Wang, Fenghui ^a   Zhao, Yulong ^a  

^a NORTHWESTERN POLYTECHNICAL UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANODE-SUPPORT; BI-LAYER; CURVATURE METHOD; ROOM TEMPERATURE; SUPPORT SUBSTRATE;

LAMINATING; MECHANICS; RESIDUAL STRESSES; STRESS ANALYSIS;

SOLID OXIDE FUEL CELLS (SOFC);

EID: 77049115678     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.839341     Document Type: Conference Paper

References (5)

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2. Evans AG, Hutchinson J W, The thermal mechanical integrity of thin films and multilays, ACTA Metallurgica et Materialia 43 (7): 2507-2530 JUL 1995.
3. C H Hsueh A G Evans, Residual stresses in metal/ceramic bonded strips, J Am Ceram Soc 68 242-249, 1985.
4. Atkinson A, Seluck A, Residual stress and fracture of laminated membranes, Acta mater 47(3) 867-874 1999.
5. A Seluck A Atkinson, Elastic properties of ceramic oxides used in solid oxide fuel cells(SOFC), J Eur Ceram Soc 17 1523-1532 1997.