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Volumn 325, Issue 4, 2010, Pages 924-935

Sub-shot-noise quantum metrology with entangled identical particles

Author keywords

Identical particles; Quantum entanglement; Quantum metrology; Sub shot noise limit

Indexed keywords


EID: 77049087510     PISSN: 00034916     EISSN: 1096035X     Source Type: Journal    
DOI: 10.1016/j.aop.2010.01.005     Document Type: Article
Times cited : (81)

References (62)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.