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Volumn 325, Issue 4, 2010, Pages 924-935
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Sub-shot-noise quantum metrology with entangled identical particles
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Author keywords
Identical particles; Quantum entanglement; Quantum metrology; Sub shot noise limit
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Indexed keywords
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EID: 77049087510
PISSN: 00034916
EISSN: 1096035X
Source Type: Journal
DOI: 10.1016/j.aop.2010.01.005 Document Type: Article |
Times cited : (81)
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References (62)
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