Electric-pulse-induced resistance switching observed in ZnO nanotube point contact system

Physica E: Low-Dimensional Systems and Nanostructures

Volumn 42, Issue 4, 2010, Pages 791-794

  Liu, Peng ^a   She, Guangwei ^b   Shi, Wensheng ^b   Chen, Dongmin ^a  

^a INSTITUTE OF PHYSICS   (China)

^b TECHNICAL INSTITUTE OF PHYSICS AND CHEMISTRY   (China)

Author keywords

Electrical pulse induced resistance effect; Nanotube; Scanning tunneling microscopy; Zinc oxide

Indexed keywords

ELECTRIC-PULSE-INDUCED RESISTANCE SWITCHING; ELECTRICAL-PULSE-INDUCED RESISTANCE EFFECT; ELECTRON TRANSPORT MEASUREMENTS; INDUCED RESISTANCE; MEMORY EFFECTS; METAL-SEMICONDUCTOR CONTACTS; PHENOMENOLOGICAL MODELS; SCANNING TUNNELING MICROSCOPY (STM); ZNO; ZNO NANOTUBE;

ELECTRIC RESISTANCE; NANOTUBES; POINT CONTACTS; SCANNING; WIND TUNNELS; ZINC; ZINC OXIDE;

SCANNING TUNNELING MICROSCOPY;

EID: 76949104017     PISSN: 13869477     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.physe.2009.11.031     Document Type: Article

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