Detection of midge-damaged wheat kernels using short-wave near-infrared hyperspectral and digital colour imaging

Biosystems Engineering

Volumn 105, Issue 3, 2010, Pages 380-387

  Singh, Chandra B ^a   Jayas, Digvir S ^a   Paliwal, Jitendra ^a   White, Noel D G ^b  

^a UNIVERSITY OF MANITOBA   (Canada)

^b Cereal Research Centre   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CLASSIFICATION (OF INFORMATION); COLOR; GRAIN (AGRICULTURAL PRODUCT); INFRARED DEVICES; SPECTROSCOPY;

HISTOGRAM FEATURES; HYPERSPECTRAL DATA; MORPHOLOGICAL FEATURES; NEAR INFRA RED; SHORT-WAVE NEAR-INFRARED; STANDARD DEVIATION; STATISTICAL CLASSIFIER; STATISTICAL FEATURES;

HYPERSPECTRAL IMAGING;

CHIRONOMIDAE; TRITICUM AESTIVUM;

EID: 76749128396     PISSN: 15375110     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.biosystemseng.2009.12.009     Document Type: Article

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