In-beam aerogel light yield characterization for the AMS RICH detector

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 614, Issue 2, 2010, Pages 237-249

  Aguilar Benitez, M ^a   Arruda, L ^b   Barao, F ^b   Barreira, G ^b   Barrau, A ^c   Baret, B ^c   Berdugo, J ^a   Buenerd M ^c   Casaus, J ^a   Cernuda, I ^a   Crespo, D ^a   de la Guia, C ^a   Delgado, C ^a   Diaz, C ^a   Derome, L ^c   Giovacchini, F ^a   Goncalves, P ^b   Keating, A ^b   Laurenti, G ^d   Malinine, A ^e   Mana C ^a   Marin J ^a   Martinez, G ^a   Menchaca Rocha, A ^f   Pereira, R ^b   Pimenta, M ^b   Seo, E S ^e   Vargas Trevino, M ^c   more..

^a CIEMAT   (Spain)

^b LIP   (Portugal)

^c UNIVERSITÉ JOSEPH FOURIER GRENOBLE 1   (France)

^d UNIVERSITY OF BOLOGNA   (Italy)

^e UNIVERSITY OF MARYLAND   (United States)

^f UNIVERSIDAD NACIONAL AUTÓNOMA DE MÉXICO   (Mexico)

Author keywords

Aerogel; Aerogel light yield; AMS; Charged particle detectors; Cherenkov imaging; RICH; Space instrumentation

Indexed keywords

AEROGEL RADIATORS; BEAM TESTS; CHERENKOV; CHERENKOV IMAGING; CONICAL REFLECTORS; DESIGN GOAL; DETECTOR PLANES; LIGHT YIELD; PRECISE MEASUREMENTS; RICH DETECTORS; RING IMAGING CHERENKOV DETECTOR; SODIUM FLUORIDE; SPACE INSTRUMENTATIONS;

AEROGELS; CHARGED PARTICLES; DETECTORS; PARTICLE ACCELERATORS; PARTICLE DETECTORS; RADIATORS; SODIUM;

CERAMIC MATERIALS;

EID: 76749124310     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2009.12.027     Document Type: Article

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