Microstructural characterization of oxides formed on model Zr alloys using synchrotron radiation

Journal of ASTM International

Volumn 5, Issue 3, 2008, Pages

  Motta, A T ^a   Da Silva, M J G ^a   Yilmazbayhan, A ^a   Comstock, R J ^b   Cai, Z ^c   Lai, B ^c  

^a The Pennsylvania State University   (United States)

^b WESTINGHOUSE ELECTRIC COMPANY   (United States)

^c ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Corrosion; Oxide phases; X ray diffraction; Zirconium alloys

Indexed keywords

ALLOY CHEMISTRY; BASE METALS; BREAKAWAY CORROSION; COMPLEX STRUCTURE; CONTROL MATERIALS; CORROSION BEHAVIOR; CORROSION KINETICS; CORROSION MECHANISMS; CORROSION OXIDES; CORROSION TESTING; CROSS SECTION; DIFFRACTION PEAKS; DIFFRACTION SIGNALS; GRAIN SIZE; IMPACT CORROSION; INTERFACIAL STRUCTURES; MICRO BEAMS; MICRO-STRUCTURAL CHARACTERIZATION; MICROBEAM X-RAY DIFFRACTION; MODEL ALLOYS; ORIENTATION RELATIONSHIP; OXIDE FORMATION; OXIDE INTERFACES; OXIDE LAYER; OXIDE PHASE; OXIDE PHASES; OXIDE PHASIS; OXIDE-METAL INTERFACE; PROTECTIVE OXIDE LAYERS; PROTECTIVE OXIDES; SMOOTH TRANSITIONS; SPECIFIC ORIENTATION; STABLE OXIDES; SYNCHROTRON RADIATION DIFFRACTIONS; ZIRCALOY-4;

ALLOYING ELEMENTS; CHROMIUM; CORROSION; DIFFRACTION; METALS; MICROSTRUCTURE; OXIDES; PHASE INTERFACES; SYNCHROTRON RADIATION; SYNCHROTRONS; TERNARY ALLOYS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZIRCONIUM; ZIRCONIUM ALLOYS;

ZIRCONIUM COMPOUNDS;

EID: 76649140122     PISSN: None     EISSN: 1546962X     Source Type: Journal    
DOI: 10.1520/JAI101257     Document Type: Article

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