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note
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In ref. PSSR we used A pl/A0\pl instead of (A pl/A0 pl)6 in the expression for C, but we have found that the latter (more rapid) cut-off, gives better results: The contact area as a function of magnification, for elastic contact with the latter C, gives virtually the same result as the calculated (total) contact area using the elastoplastic contact mechanics theory and the original surface roughness power spectrum
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As an example, using AFM we have measured the height profile of a polished steel surface over a 10μ m × 10m surface area with the resolution a = 20nm. From the numerical data we calculated the root-mean-square (rms) roughness h ≈ 0.1 m and the rms slope s ≈ 0.6. Increasing the lateral resolution would increase the slope further since the slope is mainly determined by the short-wavelength roughness
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It may be argued that, due to plastic deformation, the slope in (eq:71) should be calculated including only the roughness with wavelength above some cut-off length. However, no discussion of this point was presented in ref. Yovanovich
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It may be argued that, due to plastic deformation, the slope in (eq:71) should be calculated including only the roughness with wavelength above some cut-off length. However, no discussion of this point was presented in ref. Yovanovich
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