Measurement of inelastic-scattering cross sections in the 16O + 28Si system to discriminate regular and chaotic regimes

Brazilian Journal of Physics

Volumn 34, Issue 3 A, 2004, Pages 885-888

  Marti G V ^a   Pacheco, A J ^a   Testoni, J E ^a   Abriola, D ^a   Capurro, O A ^a   DiGregorio, D E ^a   Fernandez Niello J O ^a   Macchiavelli, A O ^b   Clark, R M ^b   Fallon, P ^b   Goergen, A ^b   Ward, D ^b   Wu, C Y ^c   Hayes, A ^c   Cline, D ^c   Teng, R ^c  

^a LABORATORIO TANDAR   (Argentina)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c UNIVERSITY OF ROCHESTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 7644229808     PISSN: 01039733     EISSN: None     Source Type: Journal    
DOI: 10.1590/S0103-97332004000500048     Document Type: Conference Paper

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