Preparation and characterization of ceramic samples of Ag 1-xKxNbO3

Indian Journal of Pure and Applied Physics

Volumn 47, Issue 10, 2009, Pages 719-724

  Nautiyal, Om Prakash ^a   Bhatt, S C ^a   Semwal, B S ^a  

^a H N B GARHWAL UNIVERSITY   (India)

Author keywords

Ceramics; Scanning electron micrographs; X ray diffraction

Indexed keywords

EID: 76349105917     PISSN: 00195596     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (11)

1. Bhatt S C, Singh K, Om Prakash, et al, Indian J Pure & Appl Phys, 45 (2007) 609.
2. Nautiyal Om Prakash, Bhatt S C, Pant R P, et al., Indian J Pure & Appl Phys, 47 (2009) 282.
3. Lukaszewski M & Ratuszna A, Acta Phys Pol, A 57 (1980) 27.
4. Kania A, J Phys D: Appl Phys, 34 (2001) 1447.
5. Valant M, Axelsson A K & Alford N, J Eur Ceram Soc, 27 (2007) 2549.
6. Fabry J, Zikmund Z, Kania A & Petricek V, Acta Cryst, C 56 (2000) 916.
7. Kania A & Kwapuliniski J, J Phys: Condens Matter, 11 (1999) 8933.
8. Wada S, Saito A, Hoshina T, et al., Japan. J Appl Phys, 45 (2006) 7389.
9. Duguey S, Lebourgeois R, Grattepain C, et al, J Eur Ceram Soc, 27 (2007) 117.
10. Kania A & Miga S, Mater Sci Eng B, 86 (2001) 128.
11. Wada S, Saito A, Hoshina T, et al, Ferroelectrics, 346 (2007) 64.