Optical mapping of the boundary of a two-dimensional electron gas by a nearfield optical microscopy

Physics Procedia

Volumn 3, Issue 2, 2010, Pages 1171-1175

  Ito, H ^a   Shibata, Y ^a   Furuya, K ^a   Kashiwaya, S ^b   Ootuka, Y ^a   Nomura, S ^a  

^a UNIVERSITY OF TSUKUBA   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

Dilution refrigerator; Near field scanning optical microscope; Two dimensional electron gas

Indexed keywords

BAR STRUCTURE; DILUTION REFRIGERATOR; GAAS/ALGAAS; MODULATION-DOPED; NEAR FIELD OPTICAL MICROSCOPY; NEAR-FIELD SCANNING OPTICAL MICROSCOPE; OPTICAL MAPPING; SEMICONDUCTOR NANOSTRUCTURES; SPATIAL PROPERTIES; SPATIAL RESOLUTION; SUB-WAVELENGTH;

ELECTRON GAS; ELECTRONS; MICROSCOPES; NEAR FIELD SCANNING OPTICAL MICROSCOPY; PHOTORESISTS; REFRIGERATORS; SCANNING; TWO DIMENSIONAL;

TWO DIMENSIONAL ELECTRON GAS;

EID: 76249113370     PISSN: 18753884     EISSN: 18753892     Source Type: Conference Proceeding    
DOI: 10.1016/j.phpro.2010.01.158     Document Type: Article

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