Structural and optical characterization of ZnO thin films deposited by sol-gel method

Journal of Optoelectronics and Advanced Materials

Volumn 11, Issue 6, 2009, Pages 790-793

  Singh, A ^a,b   Kumar, A ^b   Suri, N ^a   Kumar, S ^c   Kumar, M ^b   Khanna, P K ^a   Kumar, D ^b  

^a CENTRAL ELECTRONICS ENGINEERING RESEARCH INSTITUTE   (India)

^b KURUKSHETRA UNIVERSITY   (India)

^c INDIAN INSTITUTE OF TECHNOLOGY KANPUR   (India)

Author keywords

Raman spectroscopy; Sol gel; Zinc oxide

Indexed keywords

ATOMIC FORCE MICROSCOPY; ETHANOLAMINES; II-VI SEMICONDUCTORS; NANOCRYSTALLINE MATERIALS; OXIDE MINERALS; RAMAN SPECTROSCOPY; SOL-GEL PROCESS; SOL-GELS; THIN FILMS; ULTRAVIOLET VISIBLE SPECTROSCOPY; WIDE BAND GAP SEMICONDUCTORS; ZINC OXIDE;

2-METHOXYETHANOL; CRACK-FREE FILMS; STRUCTURAL AND OPTICAL CHARACTERIZATIONS; SURFACE PROFILERS; TRANSPARENT SOL; UV-VIS SPECTROSCOPY; ZINC ACETATE DIHYDRATE; ZNO THIN FILM;

ZINC METALLOGRAPHY;

EID: 76149115558     PISSN: 14544164     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (21)

1. A. Onodera, N. Tamaki, Y. Kawamura, T. Sawada, H. Yamashita, Jpn. J. Appl. Phys-I, 35, 5160 (1996).
2. W. J. Jeong, S. K. Kim, G. C. Park, Thin Solid Films, 180, 506 (2006).
3. G. S. Kino, R. S. Wagers, J. Appl. Phys, 44, 1480 (1973).
4. M. Suchea, S. Christoulakis, K. Moschovis, N. Katsarakis, J. Kiriakidis, Thin Sloid Films, 515, 551 (2006).
5. Z. Bai, C. Xie, M. Hu, S. Zhang, D. Zeng, Mat. Sci. and Eng.-B, 149,12 (2008).
6. J. X. Wang, X. W. Sun, A. Wei, Y. Lei, X. P. Cai, C. M. Li, Z. L. Dong, Appl. Phys. Lett 88, 233106 (2006).
7. M. H. Wang, K. A. Hu, B. Y. Zhao, N. F. Zhang, Matter. Chem. and Phys, 100, 142 (2006).
8. L. Duan, B. Lin, W. Zhang, S. Zhong, Z. Fua; Appl. Phys. Lett, 88, 232110 (2006).
9. A. Jain, P. Sagar, R. M. Mehra, Solid-State Electronics, 50 ,1420 (2006).
10. R. J. Mendelsberg, J.Kennedy, S. M. Durbin, R. J. Reeves, Current Appl. Phy, 8, 283 (2008).
11. Y. Q. Wang, S. L. Yuan, L. Liu, P. Li, X. X. Lan, Z. M. Tian, J. H. He, S.Y. Yin, J. Magnetism and Magnetic Matter, 320, 1423 (2008).
12. W. Jun, Y. Yintang, Matter. Lett, 62, 1899 (2008).
13. J. H. Lee, B. O. Park, Matter. Sci Eng.-B, 106, 242 (2004).
14. O. Pagni, N. N. Somhlahlo, C. Weichsel, A. W. R. Leitch, Physica-B, 749, 376 (2006).
15. T. Makino, G. Isoya, Y. Segawa, C. H. Chia, T. Yasuda, M. Kawasaki, A. Ohtomo, K. Tamura, H. Koinuma, J. Cryst. Growth, 289, 214 (2000).
16. B. Zhang, X. T. Zhang, H. C. Gong, Z. S. Wu, S. M. Zhou, Z. L. Du, Phys. Lett.-A, 372, 2300 (2008).
17. S. O. Briean, L. H. K. Koh and G. M. Crean, Thin Solid Films, 516, 1391 A (2008).
18. S. Mridha, D. Basak, Matter. Res. Bull, 42, 875 (2007).
19. K. A. Alim, V. A. Fonoberov, M. Shamsa, A. A. Balandin, J. Appl. Phys, 97, 124313 (2005).
20. A. Zaoui, W. Sekkal, Phy. Rev.-B, 66, 174106 (2002).
21. R. P.Wang, G. Xu, P. Jin, Phys. Rev.-B, 69, 113303 (2004).