Quick extended x-ray absorption fine structure instrument with millisecond time scale, optimized for in situ applications

Review of Scientific Instruments

Volumn 81, Issue 1, 2010, Pages

  Khalid, S ^a   Caliebe, W ^b   Siddons, P ^a   So, I ^a   Clay, B ^a   Lenhard, T ^a   Hanson, J ^a   Wang, Q ^c   Frenkel, A I ^c   Marinkovic, N ^d   Hould, N ^d   Ginder Vogel, M ^d   Landrot, G L ^d   Sparks, D L ^d   Ganjoo, A ^e,f  

^a BROOKHAVEN NATIONAL LABORATORY   (United States)

^b DESY   (Germany)

^c YESHIVA UNIVERSITY   (United States)

^d UNIVERSITY OF DELAWARE   (United States)

^e LEHIGH UNIVERSITY   (United States)

^f PPG INDUSTRIES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANGULAR RANGE; BEAM LINES; BELT SYSTEM; ENERGY RANGES; ENVIRONMENTAL SCIENCE; EXAFS; EXTENDED X-RAY ABSORPTION FINE STRUCTURES; IN-SITU; MECHANICAL NOISE; MECHANICAL SYSTEMS; MODE OF OPERATIONS; NATIONAL SYNCHROTRON LIGHT SOURCES; ON THE FLIES; SI (1 1 1); STRUCTURAL CHANGE; TIME-RESOLVED DATA; TIME-SCALES; VACUUM SYSTEM; XANES SPECTRA;

ABSORPTION; ABSORPTION SPECTRA; CAMS; DC MOTORS; LIGHT; LIGHT SOURCES; MONOCHROMATORS; MOTORS; SYNCHROTRON RADIATION; X RAY ABSORPTION; X RAY ANALYSIS;

ABSORPTION SPECTROSCOPY;

EID: 75749153037     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3276679     Document Type: Review

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