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Volumn 27, Issue 1, 2010, Pages

Effect of sputtering parameters on film composition, crystal structure, and coercivity of SmCo based films deposited on Si (100) substrates

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EID: 75749148773     PISSN: 0256307X     EISSN: 17413540     Source Type: Journal    
DOI: 10.1088/0256-307X/27/1/017501     Document Type: Article
Times cited : (14)

References (22)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.