Characterisation of copper-ammonium phosphate by X-ray powder diffraction, FT-IR and electronic microscopy (SEM)

Revista de Chimie

Volumn 60, Issue 12, 2009, Pages 1282-1284

  Morgovan, Claudia ^a   Marian, Eleonora ^a   Iovi, Aurel ^b   Bratu, Ioan ^c   Borodi, Gheorghe ^c  

^a UNIVERSITY OF ORADEA   (Romania)

^b POLITEHNICA UNIVERSITY OF TIMISOARA   (Romania)

^c NATIONAL INSTITUTE FOR RESEARCH AND DEVELOPMENT OF ISOTOPIC AND MOLECULAR TECHNOLOGIES   (Romania)

Author keywords

Copper ammonium phosphate; Electronic microscopy; Metal ammonium phosphate

Indexed keywords

EID: 75749127839     PISSN: 00347752     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (13)

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