Signal processing for non-contact NDE

Przeglad Elektrotechniczny

Volumn 86, Issue 1, 2010, Pages 249-254

  Kubinyi, Michal ^a   Docekal, Adam ^a   Ramos, Helena G ^b   Ribeiro, Artur L ^b  

^a CZECH TECHNICAL UNIVERSITY IN PRAGUE   (Czech Republic)

^b INSTITUTO SUPERIOR TÉCNICO   (Portugal)

Author keywords

Eddy current inspection; EMAT; Experimental probes; Thin material; Ultrasonic inspection

Indexed keywords

EID: 75749118539     PISSN: 00332097     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (12)

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