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Optics Letters

Volumn 35, Issue 3, 2010, Pages 360-362

Measuring morphological features using light-scattering spectroscopy and Fourier-domain low-coherence interferometry

(2) Robles, Francisco E a Wax, Adam a

a DUKE UNIVERSITY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOTTOM LAYERS; FOURIER-DOMAIN; FREQUENCY DOMAIN OPTICAL COHERENCE TOMOGRAPHY; LIGHT SCATTERING SPECTROSCOPY; LOW COHERENCE INTERFEROMETRY; MORPHOLOGICAL FEATURES; POLYSTYRENE BEADS; SPATIAL RESOLUTION; SPECTRAL INFORMATION; TIME-FREQUENCY DISTRIBUTIONS; TWO LAYERS; WHITE LIGHT SOURCES;

COHERENT LIGHT; DIELECTRIC WAVEGUIDES; FIBER OPTIC SENSORS; INTERFEROMETERS; INTERFEROMETRY; LIGHT SCATTERING; LIGHT SOURCES; POLYSTYRENES; TOMOGRAPHY; WAVE INTERFERENCE;

COHERENT SCATTERING;

ALUMINUM OXIDE; ETHYLENE GLYCOL; NANOPARTICLE; WATER;

ARTICLE; CHEMISTRY; FOURIER ANALYSIS; INTERFEROMETRY; LIGHT; METHODOLOGY; NANOTECHNOLOGY; RADIATION SCATTERING; SPECTROPHOTOMETRY; STATISTICAL MODEL; SURFACE PLASMON RESONANCE;

ALUMINUM OXIDE; ETHYLENE GLYCOL; FOURIER ANALYSIS; INTERFEROMETRY; LIGHT; MODELS, STATISTICAL; NANOPARTICLES; NANOTECHNOLOGY; SCATTERING, RADIATION; SPECTROPHOTOMETRY; SURFACE PLASMON RESONANCE; WATER;

EID: 75749105874 PISSN: 01469592 EISSN: 15394794 Source Type: Journal
DOI: 10.1364/OL.35.000360 Document Type: Article

Times cited : (37)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.