Defects analysis at the nanometric scale in Ca3Co 4O9 thin films

Applied Physics Letters

Volumn 96, Issue 4, 2010, Pages

  Moubah, R ^a   Colis, S ^a   Ulhaq Bouillet, C ^a   Dinia, A ^a  

^a UNIVERSITÉ DE STRASBOURG   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL COMPOSITIONS; CROSS SECTION; DEFECTS ANALYSIS; DEPOSITED FILMS; DIFFRACTION MODES; LATTICE PARAMETERS; NANOMETRIC SCALE; NON-STOICHIOMETRY; PULSED LASER ABLATION; STRUCTURAL DEFECT;

ABLATION; CALCIUM; DEFECTS; DIFFRACTION; PULSED LASER DEPOSITION; PULSED LASERS; SUBSTRATES; THIN FILMS;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EID: 75749102534     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3292590     Document Type: Article

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