Optical high-power nonlinearity comparison between the National Institute of Standards and Technology and The National Metrology Institute of Japan at 1480 nm

Applied Optics

Volumn 49, Issue 1, 2010, Pages 32-36

  Vayshenker, I ^a   Yang, S ^a   Amemiya, K ^b   Mukai, S ^b   Zama, T ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

MOLECULAR PHYSICS; OPTICAL FIBERS; UNCERTAINTY ANALYSIS;

ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGIES; COMPARISON METHODS; MEASUREMENTS OF; NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY; NATIONAL METROLOGY INSTITUTE OF JAPANS; NATIONAL METROLOGY INSTITUTES; POWER METERS; SUPERPOSITION METHOD;

UNITS OF MEASUREMENT;

EID: 75449098841     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.49.000032     Document Type: Article

References (16)

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