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Volumn 5426, Issue , 2004, Pages 274-284

Target recognition study using polarimetric laser radar

Author keywords

Classification; Identification; Imaging; Infrared; Ladar; Mueller; Polarization; Polarizer; Retarder; Stokes

Indexed keywords

CLASSIFICATION; IDENTIFICATION; MUELLER; POLARIZERS; RETARDER; STOKES;

EID: 7544246265     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.548615     Document Type: Conference Paper
Times cited : (22)

References (10)
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    • Breugnot, S.1    Clemenceau, P.2
  • 2
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    • Polarization active imaging
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    • P. Clemenceau, A. Dogario, and J. Stryewski, "Polarization active imaging" in Laser Radar Technology and Applications V, G. W. Kamerman, U. N. Singh, C. Werner, V. V. Molebny, Editors, Proc. SPIE 4035, 401-409 (2000).
    • (2000) Proc. SPIE , vol.4035 , pp. 401-409
    • Clemenceau, P.1    Dogario, A.2    Stryewski, J.3
  • 3
    • 0032625735 scopus 로고    scopus 로고
    • Measurements of polarization of targets of differing albedo and shadow depth
    • Targets and Backgrounds: Characterization and Representation V, W.R. Watkins, D. Clement, W.R. Reynolds, Eds.
    • Duggin, M.J., Egan, W.G., and Gregory, J., "Measurements of polarization of targets of differing albedo and shadow depth," in Targets and Backgrounds: Characterization and Representation V, W.R. Watkins, D. Clement, W.R. Reynolds, Eds., Proc. SPIE 3699, 27-37 (1999).
    • (1999) Proc. SPIE , vol.3699 , pp. 27-37
    • Duggin, M.J.1    Egan, W.G.2    Gregory, J.3
  • 4
    • 0031289033 scopus 로고    scopus 로고
    • Mueller matrix ellipsometry: A review
    • R. M. A. Azzam, "Mueller matrix ellipsometry: a review," Proc. SPIE 3121 (1997).
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    • Azzam, R.M.A.1
  • 5
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    • Interpretation of Mueller matricies based on polar decomposition
    • S.-Y. Lu and R. A. Chipman, "Interpretation of Mueller matricies based on polar decomposition," J. Opt. Soc. Am. 13(5), (1996).
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    • Lu, S.-Y.1    Chipman, R.A.2
  • 6
    • 0035759085 scopus 로고    scopus 로고
    • Measurement of Stokes parameters of materials at 1064-nm and 532nm wavelengths
    • Laser Radar and Applications VI, Gary W. Kamerman, Editor
    • S. Tan, R. M. Narayanan, and J. E. Kalshoven, "Measurement of Stokes parameters of materials at 1064-nm and 532nm wavelengths," in Laser Radar and Applications VI, Gary W. Kamerman, Editor, Proc. SPIE 4377, 263-271 (2001).
    • (2001) Proc. SPIE , vol.4377 , pp. 263-271
    • Tan, S.1    Narayanan, R.M.2    Kalshoven, J.E.3
  • 7
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    • Air Force Research Laboratory Advanced Guidance Division, http://www.mn.afrl.af.mil/public/advguid.html.
  • 8
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    • Image fusion by a ratio of low-pass pyramid
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    • Toet, A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.