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Volumn 172, Issue 1-4 SPEC. ISS., 2004, Pages 505-508
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Structure and electron density analysis of Na0.74CoO 2 by single-crystal X-ray diffraction
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Author keywords
Cobaltite; Electron density analysis; Layered structure; Maximum entropy method; NaxCoO 2; Single crystal; Structure analysis; Thermoelectric material
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Indexed keywords
CARRIER CONCENTRATION;
CHEMICAL BONDS;
CRYSTAL STRUCTURE;
ENTROPY;
HEAT FLUX;
SINGLE CRYSTALS;
STOICHIOMETRY;
SYNTHESIS (CHEMICAL);
THERMOELECTRICITY;
X RAY DIFFRACTION;
ELECTRON DENSITY ANALYSIS;
LAYERED STRUCTURES;
MAXIMUM ENTROPY METHOD (MEM);
STRUCTURE ANALYSIS;
THERMO-ELECTRONIC MATERIAL;
SODIUM COMPOUNDS;
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EID: 7544242245
PISSN: 01672738
EISSN: None
Source Type: Journal
DOI: 10.1016/j.ssi.2004.01.053 Document Type: Conference Paper |
Times cited : (15)
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References (14)
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