Electrical properties of low-dimensional chalcogenides TlCu 2-xX2 (X = Se, Te) and (Tl1-xBa x)Cu2Se2

Journal of Alloys and Compounds

Volumn 383, Issue 1-2, 2004, Pages 245-250

  Ohtani, T ^a   Taniguchi, M ^a   Sasaki, S ^a   Kishi, H ^a   Nakata, T ^a  

^a OKAYAMA UNIVERSITY OF SCIENCE   (Japan)

Author keywords

Electrical resistivity; Electron correlation; Hall coefficient; Layered chalcogenide; Thallium copper chalcogenide

Indexed keywords

ELECTRIC CONDUCTIVITY; FERMI LEVEL; HALL EFFECT; PHASE TRANSITIONS; SELENIUM COMPOUNDS; SEMICONDUCTOR MATERIALS; X RAY DIFFRACTION ANALYSIS;

ELECTRON CORRELATION; HALL COEFFICIENTS; LAYERED CHALCOGENIDE; TALLIUM COPPER CHALCOGENIDE;

THALLIUM COMPOUNDS;

EID: 7544240938     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2004.04.027     Document Type: Conference Paper

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