Dielectric behavior of copper tantalum oxide

Journal of Applied Physics

Volumn 96, Issue 8, 2004, Pages 4400-4404

  Renner, B ^a   Lunkenheimer, P ^a   Schetter, M ^a   Loidl, A ^a   Reller, A ^a   Ebbinghaus, S G ^a  

^a UNIVERSITY OF AUGSBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITORS; CHARGE CARRIERS; CHARGE TRANSFER; CRYSTAL STRUCTURE; CRYSTALLIZATION; FREQUENCIES; PERMITTIVITY; PEROVSKITE; POLARIZATION; RELAXATION PROCESSES; SCHOTTKY BARRIER DIODES; SINGLE CRYSTALS; SURFACE CHEMISTRY; TANTALUM COMPOUNDS; THERMAL EFFECTS;

CHARGE TRANSPORT; INTERFACIAL POLARIZATION; INTERNAL-BARRIER LAYER CAPACITOR (IBLC); SURFACE BARRIER LAYER CAPACITORS (SBLC);

COPPER COMPOUNDS;

EID: 7544239765     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1787914     Document Type: Article

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