Phase separation and magnetic properties of Nd60Fe 30Al10 thin films

Applied Physics Letters

Volumn 85, Issue 13, 2004, Pages 2565-2567

  Bracchi, A ^a   Samwer, K ^a   Niermann, T ^a   Seibt, M ^a   Schneider, S ^a  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BEAMS; EVAPORATION; LOW PASS FILTERS; MAGNETOMETERS; MICROSTRUCTURE; PHASE SEPARATION; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

AMORPHOUS MATRIX; ELECTRON BEAM EVAPORATION; NANOSIZED CRYSTALS;

THIN FILMS;

EID: 7544239075     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1800283     Document Type: Article

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