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Volumn 383, Issue 1-2, 2004, Pages 319-321
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Molten metal flux growth and properties of CrSi2
a b c d e e f g h h i i i i i i i i i j more.. |
Author keywords
Chromium disilicide; Crystal growth; Electrical resistivity; Flux method; Micro Vickers hardness; Oxidation resistivity
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Indexed keywords
ALUMINA;
CRYSTAL GROWTH;
CRYSTAL STRUCTURE;
ELECTRIC FURNACES;
ELECTRIC RESISTANCE;
IMPURITIES;
LATTICE CONSTANTS;
LIQUID METALS;
OXIDATION RESISTANCE;
SCANNING ELECTRON MICROSCOPY;
SINGLE CRYSTALS;
THERMODYNAMIC STABILITY;
THERMOELECTRICITY;
VICKERS HARDNESS TESTING;
CHROMIUM DISILICIDE;
FLUX GROWTH;
FLUX METHOD;
MOLTEN TIN;
CHROMIUM COMPOUNDS;
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EID: 7544230812
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2004.04.037 Document Type: Conference Paper |
Times cited : (12)
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References (5)
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