Structural and electrical properties of Cr1-xRu xSb2

Journal of Alloys and Compounds

Volumn 383, Issue 1-2, 2004, Pages 200-204

  Harada, T ^a   Kanomata, T ^a   Takahashi, Y ^a   Nashima, O ^a   Yoshida, H ^b   Kaneko, T ^b  

^a TOHOKU GAKUIN UNIVERSITY   (Japan)

^b TOHOKU UNIVERSITY   (Japan)

Author keywords

Cr1 xRuxSb2; Electrical resistivity; Hall coefficient; Hopping conduction; Marcasite structure; Thermoelectric power

Indexed keywords

ANTIFERROMAGNETIC MATERIALS; ELECTRIC CONDUCTIVITY; HALL EFFECT; HEAT TREATMENT; HOLE MOBILITY; NEUTRON DIFFRACTION; RUTHENIUM COMPOUNDS; SEMICONDUCTOR MATERIALS; X RAY POWDER DIFFRACTION;

CR1-XRUXSB2; HALL COEFFICIENT; HOPPING CONDUCTION; MARCASITE STRUCTURE; THERMOELECTRIC POWER;

CHROMIUM;

EID: 7544226871     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2004.04.058     Document Type: Conference Paper

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