Calibration of electron spectrometer resolution in attosecond streak camera

Optics Express

Volumn 18, Issue 2, 2010, Pages 1316-1322

  Feng, Ximao ^a   Gilbertson, Steve ^a   Khan, Sabih D ^a   Chini, Michael ^a   Wu, Yi ^a   Carnes, Kevin ^a   Chang, Zenghu ^a  

^a KANSAS STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

OPTICAL CONSTANTS; OPTICS;

ATTOSECONDS; AUTOIONIZATION; DRIFT TUBE; ELECTRON SPECTROMETER; ENERGY RESOLUTIONS; TIME-OF-FLIGHT SPECTROMETER; XUV PULSE;

SPECTROMETERS;

ALGORITHM; ARTICLE; CALIBRATION; EQUIPMENT; INSTRUMENTATION; METHODOLOGY; PHOTOGRAPHY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; SPECTROSCOPY; STANDARD; UNITED STATES;

ALGORITHMS; CALIBRATION; EQUIPMENT FAILURE ANALYSIS; PHOTOGRAPHY; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SPECTRUM ANALYSIS; UNITED STATES;

EID: 75249103809     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.001316     Document Type: Article

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