Characterization of transparent and nanocrystalline TiO2:Nd thin films prepared by magnetron sputtering

Acta Physica Polonica A

Volumn 116, Issue SUPPL., 2009, Pages

  Domaradzki, J ^a   Wojcieszak, D ^a   Prociow, E ^a   Kaczmarek, D ^a  

^a WROCLAW UNIVERSITY OF TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

NANOCRYSTALS; OPTICAL PROPERTIES; TITANIUM DIOXIDE;

AMORPHOUS THIN FILMS; NANOCRYSTALLINE TIO2; STRUCTURAL AND OPTICAL PROPERTIES; TIO2 THIN FILMS;

THIN FILMS;

EID: 74849133484     PISSN: 05874246     EISSN: 1898794X     Source Type: Journal    
DOI: 10.12693/aphyspola.116.s-75     Document Type: Conference Paper

References (10)

1. K. Okimura, Surf. Coat. Technol. 135, 286 (2001).
2. G. Korotcenkov, Mater. Sci. Eng. B 139, 1 (2007).
3. A. I. Martinez, D.R. Acosta, G. Cedillo, Thin Solid Films 490, 118 (2005).
4. L. Sirghi, T. Aoki, Y. Hatanaka, Thin Solid Films 422, 55 (2002).
5. L. Zheng, M. Xu, T. Xu, Sensors Actuators B 66, 28 (2000).
6. Z. Niu, X. Jia, W. Zhang, W. Chen, K. Y. Qian, Appl. Surf. Sci. 252, 2259 (2006).
7. R. Weingartner, O. Erlenbach, A. Winnacker, A. Weite, I. Brauer, H. Mendel, H. P. Strunk, C. T. M. Ribeiro, A.R. Zanatta, Opt. Mater. 28, 790 (2006).
8. Powder Diffraction File, Joint Committee on Powder Diffraction Standards ASTM Philadelphia PA, 1967, Card 21-1272.
9. Powder Diffraction File, Joint Committee on Powder Diffraction Standards ASTM Philadelphia PA, 1967, Card 21-1276.
10. D. Kaczmarek, J. Domaradzki, D. Wojcieszak, R. Wasilewski, A. Borkowska, E. L. Prociów, A. Ciszewski, Appl. Surf. Sci. 254, 4303 (2008).