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Volumn , Issue , 2009, Pages 2580-2584

Facial landmark detection system using interest-region model and edge energy function

Author keywords

Energy function; Local area; Onject recognition

Indexed keywords

AVERAGE ERRORS; BAYESIAN; DETECTION STAGE; DETECTION SYSTEM; EDGE ENERGY; ENERGY FUNCTIONS; FACIAL LANDMARK; FACIAL LANDMARK DETECTION; FERET DATABASE; INPUT IMAGE; MEASURED DATA; PRE-INFORMATION; SEARCH REGION;

EID: 74849118480     PISSN: 1062922X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICSMC.2009.5346730     Document Type: Conference Paper
Times cited : (4)

References (11)
  • 4
    • 27944482912 scopus 로고    scopus 로고
    • Fully Automatic Facial Feature Point Detection Using Gabor Feature Based Boosted Classifiers
    • Man and Cybermetics
    • Danjjela Vukadinovic and Maja Pantic "Fully Automatic Facial Feature Point Detection Using Gabor Feature Based Boosted Classifiers," IEEE Conference on System, Man and Cybermetics 2005.
    • (2005) IEEE Conference on System
    • Vukadinovic, D.1    Pantic, M.2
  • 5
  • 7
    • 0035363218 scopus 로고    scopus 로고
    • T.F. Cootes, G.J. Edwards and C.J. Taylor Active Appearance Models, IEEE Transaction on Pattern Analysis and Machine Intelligence, 23, No. June 2001.
    • T.F. Cootes, G.J. Edwards and C.J. Taylor "Active Appearance Models," IEEE Transaction on Pattern Analysis and Machine Intelligence, Vol. 23, No. June 2001.
  • 8
    • 0031187375 scopus 로고    scopus 로고
    • Face recognition by elastic bunch graph matching
    • L. Wiskott, et al., "Face recognition by elastic bunch graph matching," IEEE Trans. Pattern Analysis and Machine Intelligence, vol. 19, no. 7, pp. 775-779, 1997.
    • (1997) IEEE Trans. Pattern Analysis and Machine Intelligence , vol.19 , Issue.7 , pp. 775-779
    • Wiskott, L.1
  • 10
    • 0038719890 scopus 로고    scopus 로고
    • A Bayesian Discriminating Features Methods for Face Detection
    • C. Liu, "A Bayesian Discriminating Features Methods for Face Detection," IEEE Trans. Pattern Anal. mach. Intell., Vol. 25, pp.725-740, 2003.
    • (2003) IEEE Trans. Pattern Anal. mach. Intell , vol.25 , pp. 725-740
    • Liu, C.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.