Perspectives of combining online and offline test technology for dependable systems on a chip

Proceedings - 9th IEEE International On-Line Testing Symposium, IOLTS 2003

Volumn , Issue , 2003, Pages 183-187

  Galke, C ^a   Grabow, M ^a   Vierhaus, H T ^a  

^a BRANDENBURG UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Automatic testing; Built in self test; Circuit faults; Circuit testing; Integrated circuit technology; Integrated circuit testing; Logic devices; Logic testing; Production; System testing

Indexed keywords

AUTOMATIC TESTING; INTEGRATED CIRCUIT TESTING; INTEGRATED CIRCUITS; LOGIC CIRCUITS; LOGIC DEVICES; ONLINE SYSTEMS; PRODUCTION; RADIATION EFFECTS; SAFETY TESTING; SYSTEM-ON-CHIP;

CIRCUIT FAULTS; CIRCUIT TESTING; INTEGRATED CIRCUIT TECHNOLOGY; LOGIC TESTING; SYSTEM TESTING;

BUILT-IN SELF TEST;

EID: 74549216713     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/OLT.2003.1214396     Document Type: Conference Paper

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