Electrical properties of V2O5-doped TlI

Radiation Effects and Defects in Solids

Volumn 164, Issue 12, 2009, Pages 771-778

  Sultana, Saima ^a  

^a ALIGARH MUSLIM UNIVERSITY   (India)

Author keywords

Electrical conductivity; Electrical properties; X ray diffraction

Indexed keywords

BINARY-PHASE SYSTEMS; BULK GRAINS; COMPOSITION RANGES; ELECTRICAL CONDUCTIVITY; ELECTRICAL PROPERTY; INTERFACE BOUNDARIES; PURE COMPOUNDS; SPACE CHARGES; UPWARD TREND; VANADIA;

DIFFERENTIAL SCANNING CALORIMETRY; DIFFRACTION; ELECTRIC CONDUCTIVITY; PHASE INTERFACES; SCANNING ELECTRON MICROSCOPY; THALLIUM; VANADIUM COMPOUNDS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

PHASE TRANSITIONS;

EID: 74549184122     PISSN: 10420150     EISSN: 10294953     Source Type: Journal    
DOI: 10.1080/10420150903273047     Document Type: Article

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