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Applied Physics Letters

Volumn 96, Issue 2, 2010, Pages

Thickness dependence of the critical current density in superconducting films: A geometrical approach

(3) Hengstberger, F a Eisterer, M a Weber, H W a

a VIENNA UNIVERSITY OF TECHNOLOGY (Austria)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED FIELD; COATED CONDUCTORS; CURRENT DENSITY DISTRIBUTION; MAGNETIC INDUCTION; NUMERICAL SIMULATION; SELF FIELD; SUPERCONDUCTING LAYER; SUPERCURRENTS; THICKNESS DEPENDENCE;

COMPUTER SIMULATION; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); CRITICAL CURRENTS; MAGNETIC FIELDS; SUPERCONDUCTING WIRE; SUPERCONDUCTIVITY;

SUPERCONDUCTING FILMS;

EID: 74549175105 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3290254 Document Type: Article

Times cited : (32)

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