The propagation model of rfid systems in ETC

Proceedings of 2009 IEEE International Conference on Communications Technology and Applications, IEEE ICCTA2009

Volumn , Issue , 2009, Pages 54-57

  Weidong, Wang ^a   Yinghai, Zhang ^a   Wei, Yao ^a   Shoufeng, Wang ^a  

^a BEIJING UNIVERSITY OF POSTS AND TELECOMMUNICATIONS   (China)

Author keywords

ETC; Fading; Multipath effect; N Ray; RFID

Indexed keywords

MULTI-PATH EFFECT; PROPAGATION MODELS; RFID SYSTEMS; WIRELESS SYSTEMS;

EID: 74549115932     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/ICCOMTA.2009.5349238     Document Type: Conference Paper

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