A new parameter extraction approach for the circuit-based models of FETs

Proceedings of the 4th IEEE-Russia Conference - 2003 Microwave Electronics: Measurements, Identification, Applications, MEMIA 2003

Volumn , Issue , 2003, Pages 38-42

  Vikhorev, A G ^a   Pashkovsky, A B ^b   Snournitsin, V R ^a   Sudeiko, G I ^c  

^a NOVOSIBIRSK STATE TECHNICAL UNIVERSITY   (Russian Federation)

^b Federal State Unitary Enterprise   (Russian Federation)

^c Joint Stock Company Oktava   (Russian Federation)

Author keywords

Analytical models; Circuit simulation; Data mining; Equivalent circuits; FETs; Frequency measurement; Mathematical model; Parameter extraction; Scattering parameters; Smoothing methods

Indexed keywords

ANALYTICAL MODELS; CIRCUIT SIMULATION; DATA MINING; ELECTRIC NETWORK ANALYSIS; EQUIVALENT CIRCUITS; EXTRACTION; MATHEMATICAL MODELS; PARAMETER EXTRACTION; SCATTERING PARAMETERS;

ANALYTICAL EXPRESSIONS; CIRCUIT-BASED MODELS; FET MODELING; FETS; FREQUENCY MEASUREMENTS; GENESYS; OPTIMIZATION PROCEDURES; SMOOTHING METHODS;

PARAMETER ESTIMATION;

EID: 74449091619     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MEMIA.2003.238601     Document Type: Conference Paper

References (5)

1. Fyung-Whan Weom, Tue-Suk Ha and Jung-Woong Ra, "Frequency Dependence of GaAs FET Equivalent Circuit Elements Extracted from the measured Two-Port S Parameters," Proc. of the IEEE, vol. 76, Num. 7, July 1988, pp. 843-845.
2. Antony Davies and Adam K. Jastrzebski, "Parameter Extraction Technique for Non-Linear MESFET Models," IEEE MTT-S Digest, 1990, pp. 747-750.
3. Volker Sommer, "A New Method to Determine the Source Resistance Of FET from Measured S-Parameters Under Active-Bias Conditions," IEEE Trans. Microwave Theory Tech., 1995, vol. 43, no.3, pp. 504-510.
4. A.N. Tikhonov, V.Ya. Arsenin. Methods of the solutions of a poorly conditional problem. Moscow, Nauka, 1986, 288 p. (In Russian).
5. I.D. Faux, M.J. Pratt. Computational Geometry for Design and Manufacture. John Wiley & Sons.