Debye-type relaxation in yittria stabilized zirconia

Journal of Alloys and Compounds

Volumn 491, Issue 1-2, 2010, Pages 30-35

  Biswas, Mridula ^a,b  

^a NAVAL MATERIALS RESEARCH LABORATORY   (India)

^b INDIAN INSTITUTE OF ENGINEERING SCIENCE AND TECHNOLOGY   (India)

Author keywords

Ionic conduction; Oxide materials; X ray diffraction

Indexed keywords

AC CONDUCTIVITY; DC CONDUCTIVITY; DEBYE-TYPE RELAXATION; DIELECTRIC LOSS SPECTRA; ELECTRIC MODULUS; FREQUENCY RANGES; HIGH TEMPERATURE; HIGH TEMPERATURE RANGE; HIGHER FREQUENCIES; ION CONDUCTION; LOSS CURRENTS; LOW FREQUENCY; OBSERVED DATA; OXIDE MATERIALS; RELATIVE DIELECTRIC CONSTANT; STABILIZED ZIRCONIA; TEMPERATURE INCREASE;

DIELECTRIC DEVICES; DIELECTRIC LOSSES; DIFFRACTION; GRAIN BOUNDARIES; IONIC CONDUCTION; X RAY DIFFRACTION; ZIRCONIA;

DIELECTRIC MATERIALS;

EID: 74449090196     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2009.10.233     Document Type: Article

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