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Volumn 396, Issue 4-6, 2004, Pages 329-334

Determination of interfacial dielectric constant of AOT-based reverse micelle by probing magnetic field effect on pyrene-DMA exciplex luminescence

Author keywords

[No Author keywords available]

Indexed keywords

N,N DIMETHYLANILINE; PYRENE;

EID: 7444261417     PISSN: 00092614     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cplett.2004.08.052     Document Type: Article
Times cited : (18)

References (34)
  • 12
    • 0003980934 scopus 로고
    • P.L. Luisi E.B. Straub Plenum Press New York
    • M.A.J. Rodgers P.L. Luisi E.B. Straub reverse Micelle 1984 Plenum Press New York 165 174
    • (1984) Reverse Micelle , pp. 165-174
    • Rodgers, M.A.J.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.