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Applied Physics Letters

Volumn 25, Issue 12, 1974, Pages 705-707

Disorder-induced carrier localization in silicon surface inversion layers

(1) Arnold, Emil a

a PHILIPS RESEARCH LABORATORIES (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 7444242961 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1655369 Document Type: Article

Times cited : (90)

References (16)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.