Bulk and surface charge collection: CDMS detector performance and design implications

AIP Conference Proceedings

Volumn 1185, Issue , 2009, Pages 643-646

  Bailey, C N ^a   Ahmed, Z ^b   Akerib, D S ^a   Arrenberg, S ^c   Balakishiyeva, D ^d   Baudis, L ^c   Bauer, D A ^e   Beaty, J ^f   Brink R l , ^g   Bmch, T ^c   Bunker, R ^h   Cabrera, B ^g   Caldwell, D O ^h   Clark, K ^a   Cooley, J ^g   Cushman, R ^f   DeJongh, F ^e   Dragowsky, M R ^a   Duong, L ^f   Figueroa Feliciano, E ⁱ   Filippini, J ^b,j   Fritts, M ^f   Golwala, S R ^b   Grant, D R ^a   Hall, J ^e   Hennings Yeomans, R ^a   Hertel, S ⁱ   Hojem, A ^a   Homgren, D ^e   Hsu, L ^e   Huber, M E ^k   Kamaev, O ^f   Kiveni, M ^l   Kos, M ^l   Leman, S W ⁱ   Mahapatra, S R ^m   Mandic, V ^f   Moore, D ^b   McCarthy, K A ⁱ   Mirabolfathi, N ^j   Nelson, H ^h   Ogburn, R W ^b,g   Pyle, M ^g   Qiu, X ^f   Ramberg, E ^e   Rau, W ⁿ   Reisetter, A ^f,o   Saab, T ^d   Sadoulet, B ^j,p   Sander, J ^h   Schnee, R W ^l   Seitz, D N ^j   Serfass, B ^j   Sundqvist, K M ^j   Tomada, A ^g   Wang, G ^b   Whilden, M ^a   Yellin, S ^b,g   Yoo, J ^e   Young, B A ^q   more..

^a CASE WESTERN RESERVE UNIVERSITY   (United States)

^b California Institute of Technology   (United States)

^c PHYSIK INSTITUT DER UNIVERSITÄT ZÜRICH   (Switzerland)

^d University of Florida   (United States)

^e FERMI NATIONAL ACCELERATOR LABORATORY   (United States)

^f University of Minnesota   (United States)

^g STANFORD UNIVERSITY   (United States)

^h UNIVERSITY OF CALIFORNIA   (United States)

ⁱ MASSACHUSETTS INSTITUTE OF TECHNOLOGY   (United States)

^j UNIVERSITY OF CALIFORNIA   (United States)

^k UNIVERSITY OF COLORADO   (United States)

^l SYRACUSE UNIVERSITY   (United States)

^m TEXAS A AND M UNIVERSITY   (United States)

ⁿ QUEEN S UNIVERSITY   (Canada)

^o ST OLAF COLLEGE   (United States)

^p LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^q SANTA CLARA UNIVERSITY   (United States)

more..

Author keywords

CDMS; Charge Collection; Dark Matter; SuperCDMS

Indexed keywords

EID: 74349113008     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3292423     Document Type: Conference Paper

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