Optimizing transition-edge sensor design for high count-rate applications

AIP Conference Proceedings

Volumn 1185, Issue , 2009, Pages 23-26

  Smith, Stephen J ^a,b   Adams, Joe S ^a,b   Bandler, Simon R ^a,c   Brekosky, Regis P ^a,d   Brown, Ari D ^a,e   Chervenak, James A ^a   Eckart, Megan E ^a   Finkbeiner, Fred M ^a,f   Kelley, Richard L ^a   Kilbourne, Caroline A ^a   Porter, F Scott ^a   Sadleir, John E ^a,g  

^a NASA GODDARD SPACE FLIGHT CENTER   (United States)

^b UNIVERSITY OF MARYLAND BALTIMORE COUNTY   (United States)

^c UNIVERSITY OF MARYLAND   (United States)

^d NORTHROP GRUMMAN CORPORATION   (United States)

^e MEI Technologies   (United States)

^f Wyle Information Systems   (United States)

^g United States of America   (United States)

Author keywords

Excess noise; Imaging array; Transition edge sensor

Indexed keywords

EID: 74349112767     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3292322     Document Type: Conference Paper

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