Surface electron rejection from ge detector with interleaved charge and phonon channels

AIP Conference Proceedings

Volumn 1185, Issue , 2009, Pages 223-226

  Pyle, M ^a   Serfass, B ^b   Brink, P L ^a   Cabrera, B ^a   Cherry, M ^a   Mirabolfathi, N ^b   Novak, L ^a   Sadoulet, B ^b   Seitz, D ^b   Sundqvist, K M ^b   Tomada, A ^a   Yen, J J ^b   Young, B A ^c  

^a STANFORD UNIVERSITY   (United States)

^b UNIVERSITY OF CALIFORNIA   (United States)

^c SANTA CLARA UNIVERSITY   (United States)

Author keywords

CDMS; Interleaved charge; Ionization and phonon; QET; TES; Transition edge sensor; Tungsten; ZIP

Indexed keywords

EID: 74349103697     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3292319     Document Type: Conference Paper

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