TEM-XRD analysis of PdO particles on TiO2 support for chemochromic detection of hydrogen

Sensors and Actuators, B: Chemical

Volumn 144, Issue 1, 2010, Pages 208-214

  Mohajeri, Nahid ^a   T Raissi, Ali ^a   Bokerman, Gary ^a   Captain, Janine E ^b   Peterson, Barbara V ^b   Whitten, Mary ^c   Trigwell, Steve ^b   Berger, Cristina ^c   Brenner, James ^d  

^a UNIVERSITY OF CENTRAL FLORIDA   (United States)

^b KENNEDY SPACE CENTER   (United States)

^c UNIVERSITY OF CENTRAL FLORIDA   (United States)

^d Department of Chemical Engineering ^*  (United States)

Author keywords

Chemochromic hydrogen sensor; Pigment; Transmission Electron Microscope; X ray diffraction; X ray photoelectron spectroscopy

Indexed keywords

CHEMOCHROMIC HYDROGEN SENSOR; COLOR CONTRAST; CRYSTALLINE PHASE; CRYSTALLINE STRUCTURE; FLORIDA SOLAR ENERGY CENTERS; HYDROGEN DETECTION; HYDROGEN GAS SENSING; HYDROGEN LEAK; HYDROGEN SENSOR; KENNEDY SPACE CENTERS; LABORATORY ENVIRONMENT; MATRIX; NATIONAL AERONAUTICS AND SPACE ADMINISTRATIONS; ONE-FORM; PARTICLE SIZE DISTRIBUTION ANALYSIS; SENSING MATERIAL; SUPPORTED PALLADIUM; TEM; TIO; TRANSMISSION ELECTRON MICROSCOPE; XRD ANALYSIS;

ADDITIVES; BLENDING; CRYSTALLINE MATERIALS; DIFFRACTION; ELECTRON MICROSCOPES; ELECTRONS; GAS SENSING ELECTRODES; HYDROGEN; NASA; PAINT; PALLADIUM; PARTICLE SIZE ANALYSIS; PHOTOELECTRICITY; PHOTOIONIZATION; PHOTONS; PROTON EXCHANGE MEMBRANE FUEL CELLS (PEMFC); SEMICONDUCTOR QUANTUM WIRES; SENSORS; SILICONES; SOLAR ENERGY; SPACE PLATFORMS; TITANIUM DIOXIDE; TRANSMISSION ELECTRON MICROSCOPY; X RAY ANALYSIS; X RAY DIFFRACTION;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 74349100221     PISSN: 09254005     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.snb.2009.10.064     Document Type: Article

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