Unusually large structural stability of terbium oxide phase under high pressure

Journal of Alloys and Compounds

Volumn 490, Issue 1-2, 2010, Pages 47-49

  Lonappan, Dayana ^a,b   Chandra Shekar, N V ^a   Sahu, P Ch ^a   Kumar, J ^b   Paul, Ranita ^a   Paul, Pinaki ^a  

^a INDIRA GANDHI CENTRE FOR ATOMIC RESEARCH   (India)

^b ANNA UNIVERSITY   (India)

Author keywords

Electron emission spectroscopy; High pressure; Oxide materials; Phase transitions; Rare earth alloys and compounds; X ray diffraction

Indexed keywords

AMBIENT CONDITIONS; BULK MODULUS; DIAMOND-ANVIL CELL; DIFFRACTION PEAKS; FLUORITE STRUCTURE; HIGH PRESSURE; HIGH-PRESSURE X-RAY DIFFRACTIONS; OXIDE MATERIALS; OXIDE PHASE; PARENT PHASE; PRESSURE DERIVATIVES; RARE-EARTH ALLOYS AND COMPOUNDS; RARE-EARTH SESQUIOXIDES; ROOM TEMPERATURE; STRUCTURAL PHASE TRANSITION; STRUCTURAL STABILITIES; XPS SPECTRA;

DIFFRACTION; ELECTRON EMISSION; EMISSION SPECTROSCOPY; FLUORSPAR; HIGH PRESSURE ENGINEERING; RARE EARTHS; STABILITY; TERBIUM; TERBIUM ALLOYS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

PHASE TRANSITIONS;

EID: 74149092753     PISSN: 09258388     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jallcom.2009.10.068     Document Type: Article

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