Synthesis and characterization of ultra-fine Y2O 3:Eu3+ nanophosphors for luminescent security ink applications

Nanotechnology

Volumn 21, Issue 5, 2010, Pages

  Gupta, Bipin Kumar ^a   Haranath, D ^a   Saini, Shikha ^a   Singh, V N ^b   Shanker, V ^a  

^a NATIONAL PHYSICAL LABORATORY   (India)

^b INDIAN INSTITUTE OF TECHNOLOGY DELHI   (India)

Author keywords

[No Author keywords available]

Indexed keywords

ADVANCED APPLICATIONS; AVERAGE DIAMETER; COLLOIDAL SOLUTIONS; CRYSTAL QUALITIES; DECAY TIME; LATTICE FRINGES; NANOPHOSPHORS; PHOTOLUMINESCENCE EMISSION; SECURITY CODES; SECURITY INKS; SIMPLE METHOD; SOL-GEL TECHNIQUE; SYNTHESIS AND CHARACTERIZATION; TIME-RESOLVED EMISSION SPECTROSCOPY;

EMISSION SPECTROSCOPY; EUROPIUM; INK; LUMINESCENCE; LUMINESCENT DEVICES; NETWORK SECURITY; OPTOELECTRONIC DEVICES; SEMICONDUCTOR QUANTUM WELLS;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY;

EUROPIUM; INK; LUMINESCENT AGENT; METAL NANOPARTICLE; YTTRIA; YTTRIUM;

ARTICLE; CHEMISTRY; ORGANIZATION AND MANAGEMENT; SCANNING ELECTRON MICROSCOPY; TEMPERATURE; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EUROPIUM; INK; LUMINESCENT AGENTS; METAL NANOPARTICLES; MICROSCOPY, ELECTRON, SCANNING; MICROSCOPY, ELECTRON, TRANSMISSION; SECURITY MEASURES; TEMPERATURE; X-RAY DIFFRACTION; YTTRIUM;

EID: 73949115776     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/21/5/055607     Document Type: Article

References (34)

1. Wang H, Uehara M, Nakamura H, Miyazaki M and Maeda H 2005 Adv. Mater. 17 2506
2. Moronne M B M, Gin P, Weiss S and Alivisatos A P 1998 Science 281 2013
3. Buhler G and Feldmann C 2007 Appl. Phys. A 87 631
4. Riwotzki K, Meyssamy H, Kornowski A and Hasse M 2000 J. Phys. Chem. B 104 2824
5. Vetrone F, Boyer J-C and Capobianco J 2004 Encyclopedia of Nanoscience and Nanotechnology vol 10 ed H S Nalwa (Stevenson Ranch, CA: American Scientific Publisher) p725
6. Hirai T, Orikoshi T and Komasawa I 2002 Chem. Mater. 14 3576
7. Zhang J, Wang S, Rong T and Chen L 2004 J. Am. Ceram. Soc. 87 1072
8. Capobianco J A, Vetrone F, Boyer J C, Speghini A and Bettinelli M 2002 J. Phys. Chem. B 106 1181
9. Eilers H 2006 Mater. Lett. 60 214
10. De G, Qin W, Zhang J, Wang Y, Cao C and Cui Y 2006 J. Lumin. 119 258
11. Wang X and Li Y 2003 Chem.-Eur. J. 9 5627
12. Yang L, Tang Y, Chen X, Li Y and Cao X 2007 Mater. Chem. Phys. 101 195
13. Wu G S, Lin Y, Yuan X Y, Xie T, Cheng B C and Zhang L D 2004 Nanotechnology 15 568
14. Fang Y-P, Xu A-W, You L-P, Song R-Q, Yu J C, Zhang H-X, Li Q and Liu H-Q 2003 Adv. Funct. Mater. 13 955
15. Pires A M, Serra O A, Heer S and Gudel H U 2005 J. Appl. Phys. 98 63529
16. Capobianco J A, Vetrone F, D'Alesio T, Tessari G, Speghini A and Bettinelli M 2000 Phys. Chem. Chem. Phys. 2 3203
17. Xu Z, Hong Z, Zhao Q, Peng L and Zhang P 2006 J. Rare Earths 24 111
18. Tang Q, Liu Z, Li S, Zhang S, Liu X and Qian Y 2003 J. Cryst. Growth 259 208
19. Rajasekharan V V and Buttry D A 2006 Chem. Mater. 18 4541
20. Silver J, Martinez-Rubio M I, Ireland T G, Fesrn G R and Withnall R 2001 J. Phys. Chem. B 105 948
21. Gordon W O, Tissue B M and Morris J R 2007 J. Phys. Chem. C 111 3233
22. Mao Y, Huang J, Ostroumov R, Wang K L and Chang J P 2008 J. Phys. Chem. C 112 2278
23. Li X, Li Q, Wang J and Li J 2007 J. Lumin. 124 351
24. Matsuura D, Hattori H and Takano A 2005 J. Electrochem. Soc. 152 H39
25. Kim S et al 2004 Nat. Biotechnol. 22 93
26. Xu L, Wei B, Zhang Z, Lu Z, Gao H and Zhang Y 2006 Nanotechnology 17 4327
27. Kushida T and Tanaka M 2002 Phys. Rev. B 65 195118
28. Wakefield G, Holland E, Dobson P J and Hutchison J L 2001 Adv. Mater. 13 1557
29. Konrad A, Fries T, Gahn A, Kummer F, Herr U, Tideeks R and Samwer K 1999 J. Appl. Phys. 86 3129
30. Strek W, Zych E and Hreniak D 2002 J. Alloys Compounds 344 332
31. Cho J Y, Ko K-Y and Do V 2007 Thin Solid Films 515 3373
32. Zhang W-W, Zhang W-P, Xie P-B, Yin M, Chen H-T, Jing L, Zhang Y-S, Lou L-R and Xia S-D 2003 J. Colloid Interface Sci. 262 588
33. Ozawa L, Forest H, Jaffe P M and Ban G 1971 J. Electrochem. Soc. 118 482
34. Mauthner G, Landfester K, Kock A, Bruckl H, Kast M, Stepper C and List E J W 2008 Org. Electron. 9 164