Enhanced resolution in structured media

SIAM Journal on Applied Mathematics

Volumn 70, Issue 5, 2009, Pages 1428-1452

  Ammari, Habib ^a   Bonnetier, Eric ^b   Capdeboscq, Yves ^c  

^a INSTITUT LANGEVIN   (France)

^b UNIV GRENOBLE ALPES   (France)

^c UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Defect; Imaging; Periodic background structure; Resolution; Superresolution

Indexed keywords

DEFECT IMAGING; FOCAL SPOT; MATERIAL PARAMETER; RESOLUTION ENHANCEMENT; STRUCTURED MEDIA; SUPER RESOLUTION;

OPTICAL RESOLVING POWER;

PERIODIC STRUCTURES;

EID: 73949101928     PISSN: 00361399     EISSN: None     Source Type: Journal    
DOI: 10.1137/090748639     Document Type: Article

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