Nanothermometer using single crystal silver nanospheres

Advanced Materials

Volumn 21, Issue 47, 2009, Pages 4839-4844

  Lan, Yucheng ^b   Wang, Hui ^b   Chen, Xiaoyuan ^a   Wang, Dezhi ^b   Chen, Gang ^a   Ren, Zhifeng ^b  

^a Massachusetts Institute of Technology Cambridge   (United States)

^b BOSTON COLLEGE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AREAL DENSITIES; EX SITU; IN-SITU TEMPERATURE; MAXIMUM TEMPERATURE; SPATIAL RESOLUTION; TEMPERATURE DEPENDENT;

CARBON FILMS; NANOSPHERES; SINGLE CRYSTALS;

SILVER;

EID: 73949087049     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/adma.200901313     Document Type: Article

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