Phase-sensitive terahertz spectroscopy with backward-wave oscillators in reflection mode

Review of Scientific Instruments

Volumn 80, Issue 12, 2009, Pages

  Pronin, A V ^a   Goncharov, Yu G ^b   Fischer, T ^a   Wosnitza, J ^a  

^a INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

^b PROKHOROV GENERAL PHYSICS INSTITUTE   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

ACCURATE MEASUREMENT; BACKWARD WAVE OSCILLATOR; COHERENT RADIATION; COMPLEX CONDUCTIVITY; COMPLEX DIELECTRIC FUNCTIONS; COMPLEX DYNAMICS; COMPLEX REFLECTION; COMPLEX REFLECTION COEFFICIENT; DIELECTRIC PERMITTIVITIES; ELECTRODYNAMIC PROPERTIES; KRAMERS-KRONIG TRANSFORMATION; MEASUREMENT FREQUENCY; PHASE-SENSITIVE; REFLECTION MODES; SAMPLE SURFACE; TRANSMISSION MEASUREMENTS;

CAPILLARITY; COLOSSAL MAGNETORESISTANCE; DIELECTRIC MATERIALS; ELECTRIC RESISTANCE; EXTRACTION; MAGNETIC FIELD EFFECTS; MAGNETIC MATERIALS; MAGNETIC PERMEABILITY; METAMATERIALS; MICHELSON INTERFEROMETERS; MICROWAVE OSCILLATORS; PLASMA OSCILLATIONS; TERAHERTZ SPECTROSCOPY; TERAHERTZ WAVES;

REFLECTION;

EID: 73849114854     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3271035     Document Type: Article

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