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Volumn 48, Issue 11, 2009, Pages

Growth and characterization of highly tensile-strained Ge on In xGa1-xAs virtual substrate by solid source molecular beam epitaxy

Author keywords

[No Author keywords available]

Indexed keywords

BUFFER METHOD; GE FILMS; IN-MOLE-FRACTION; MULTI JUNCTION SOLAR CELLS; PROMISING MATERIALS; SI-BASED OPTOELECTRONICS; SOLID SOURCE MOLECULAR BEAM EPITAXY; STRAIN-RELAXED; STRAINED-GE; VIRTUAL SUBSTRATES;

EID: 73849087714     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.48.111102     Document Type: Article
Times cited : (19)

References (20)
  • 19
    • 85111791628 scopus 로고    scopus 로고
    • ECS Trans
    • A. Yamada, H. Ishihara, and K. Inoue: ECS Trans. 16 (2008) No. 10, 623.
    • (2008) , vol.16 , Issue.10 , pp. 623
    • Yamada, A.1    Ishihara, H.2    Inoue, K.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.