A simplified model of multiscale electrical contact resistance and comparison to existing closed form models

Electrical Contacts, Proceedings of the Annual Holm Conference on Electrical Contacts

Volumn , Issue , 2009, Pages 27-34

  Jackson, Robert L ^a   Malucci, Robert D ^b   Angadi, Santosh ^a   Polchow, J Robert ^a  

^a AUBURN UNIVERSITY   (United States)

^b RD Malucci Consulting   (United States)

Author keywords

Contact resistance; Electrical resistance; Roughness; Surface contact

Indexed keywords

CIRCUIT BREAKER; CLOSED FORM; CLOSED-FORM MODELS; COMPLIANT PIN; CONTACT OF ROUGH SURFACE; ELECTRICAL CONNECTORS; ELECTRICAL CONTACT RESISTANCE; ELECTRICAL RESISTANCES; MULTIPLE SCALE; MULTISCALE MODELS; MULTISCALES; OTHER APPLICATIONS; ROUGH SURFACE CONTACTS; ROUGHNESS; ROUGHNESS SURFACES; SIMPLIFIED MODELS;

CONTACT RESISTANCE; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CONNECTORS; ELECTRIC CONTACTS; MAGNETIC DISK STORAGE; SURFACE MEASUREMENT; SURFACE MORPHOLOGY;

SURFACE RESISTANCE;

EID: 73649118847     PISSN: 03614395     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/HOLM.2009.5284427     Document Type: Conference Paper

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