Multidimensional near- and far-field measurements of broad ridge (Al,In)GaN laser diodes

Physica Status Solidi (C) Current Topics in Solid State Physics

Volumn 6, Issue SUPPL. 2, 2009, Pages

  Rogowsky, Stephan ^a   Braun, Harald ^a   Schwarz, Ulrich T ^a   Brüninghoff, Stefanie ^b   Lell, Alfred ^b   Strauß, Uwe ^b  

^a UNIVERSITY OF REGENSBURG   (Germany)

^b OSRAM OPTO SEMICONDUCTORS GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

FAR FIELD MEASUREMENT; FAR-FIELD; GAN LASER DIODES; LENS SYSTEMS; MAGNIFIED IMAGES; MICROSCOPE OBJECTIVE; MULTIMODES; NEAR-FIELD; NEAR-FIELD INTENSITY; SPATIAL RESOLUTION; SPECTRAL INFORMATION; UV- AND;

ALUMINUM; CAMERAS; CCD CAMERAS; GALLIUM ALLOYS; HETEROJUNCTIONS; OPTICAL FIBERS;

GALLIUM NITRIDE;

EID: 73649105664     PISSN: 18626351     EISSN: 16101642     Source Type: Journal    
DOI: 10.1002/pssc.200880853     Document Type: Article

References (5)

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2. H. Braun, S. Rogowsky, B. Schmidtke, U. T. Schwarz, S. Brüninghoff, A. Lell, and U. Strauß, Phys. Status Solidi A 206(6), 1211 (2009) (this confererence).
3. D. Scholz, H. Braun, U. T. Schwarz, D. Queren, S. Brüninghoff, A. Lell, and U. Strauß, Opt. Express 16, 6846 (2008).
4. H. Kogelnik and T. Li, Appl. Optics 5(10), 1550 (1966).
5. Christopher C. Davis, Lasers and Electro-Optics: Fundamentals and Engineering (Cambridge University Press, Cambridge, 2000).